{"id":1196,"date":"2026-01-15T13:42:42","date_gmt":"2026-01-15T13:42:42","guid":{"rendered":"https:\/\/heldplants.net\/index.php\/2026\/01\/15\/ng-tests-new-radiation-hardening-microelectronics-system\/"},"modified":"2026-01-15T13:42:42","modified_gmt":"2026-01-15T13:42:42","slug":"ng-tests-new-radiation-hardening-microelectronics-system","status":"publish","type":"post","link":"https:\/\/heldplants.net\/index.php\/2026\/01\/15\/ng-tests-new-radiation-hardening-microelectronics-system\/","title":{"rendered":"NG tests new radiation-hardening microelectronics system"},"content":{"rendered":"<p><img width=\"1920\" height=\"1080\" src=\"data:image\/gif;base64,R0lGODlhAQABAAAAACH5BAEKAAEALAAAAAABAAEAAAICTAEAOw==\" class=\"attachment-full size-full wp-post-image lazyload\" alt=\"\" style=\"float:right; margin:0 0 10px 10px;\" decoding=\"async\" fetchpriority=\"high\" sizes=\"(max-width: 1920px) 100vw, 1920px\" data-src=\"https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB.jpeg\" data-srcset=\"https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB.jpeg 1920w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-800x450.jpeg 800w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-1600x900.jpeg 1600w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-768x432.jpeg 768w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-1536x864.jpeg 1536w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-747x420.jpeg 747w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-696x392.jpeg 696w, https:\/\/defence-blog.com\/wp-content\/uploads\/2026\/01\/G-jeN3dXgAAu-hB-1068x601.jpeg 1068w\">Northrop Grumman has demonstrated a secure testing environment for radiation-exposed microelectronics under DARPA\u2019s ASSERT program, the company announced on January 13, 2026. According to Northrop Grumman, the achievement is part of DARPA\u2019s Advanced Sources for Single-event Effects Radiation Testing (ASSERT) effort, which aims to create compact laboratory alternatives to heavy-ion test facilities. The company said [&#8230;]<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Northrop Grumman has demonstrated a secure testing environment for radiation-exposed microelectronics under DARPA\u2019s ASSERT program, the company announced on January 13, 2026. According to Northrop G<\/p>\n","protected":false},"author":0,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[12],"tags":[],"class_list":["post-1196","post","type-post","status-publish","format-standard","hentry","category-news"],"_links":{"self":[{"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/posts\/1196","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/types\/post"}],"replies":[{"embeddable":true,"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/comments?post=1196"}],"version-history":[{"count":0,"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/posts\/1196\/revisions"}],"wp:attachment":[{"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/media?parent=1196"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/categories?post=1196"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/heldplants.net\/index.php\/wp-json\/wp\/v2\/tags?post=1196"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}